As part of Battelle’s 11th International Conference on Remediation of Chlorinated and Recalcitrant Compounds in Palm Springs, CA, April 8-12, 2018, John will be conducting a full-day course at the event.
**Registration for the conference is not required. Reserve your seat now before they fill up!! Registration after February 23rd will be $375.
Sunday, April 8, 2018
8:00 a.m.–5:00 p.m.
(1-hour break at noon for lunch on own)
John V. Fontana, PG (Vista GeoScience)
Daniel Pipp (Geoprobe Systems)
Objective: This course will review the current state of technology regarding direct-push subsurface imaging tools, including: the membrane interface probe (MIP), low-level MIP, electrical conductivity (EC), hydraulic profiler tool (HPT), combined tools (MiHPT), and the new optical image profiler (OIP) tool for identifying nonaqueouse-phase liquid (NAPL) fluorescence.Continue reading